Abstract:The increasing power consumption during the chip testing process has become the bottleneck of chip production and testing for micro-nano VLSI circuits. Numerous low power design-for-testability (DfT) techniques have been proposed to deal with the test power problem, and segmented scan method was shown to be an efficient solution. We propose a new poweraware scan segment architecture, which can accurately control the power of shift and capture cycles at the same time. Since enabling only a subset of scan flip-flops to capture test responses in one cycle compromises the fault coverage, we propose a new method to reduce the fault coverage loss. First, we use a more accurate notion, spoiled nodes, instead of violation edges used in previous works to analyse the ependency of flip-flops, then we use simulated annealing(SA) mechanism to find the best combination of these flip-flops while considering the clock trees' impact. To the best of our knowledge, this is the first work to make shift and capture power in a controllable way with minimum fault coverage loss, small test-data volume and no extra hardware overhead for at-speed transition fault test. Extensive experiments have been performed on reference circuit ISCAS89 and IWLS2005 to verify the effectiveness of the proposed method.

Localizing Test Power Consumption for Scan Testing

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture.

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

Low-power Technique of Scan-Based Design for Test

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

A Scan Design Method Based on Two Complementary Connection Styles to Minimize Test Power

An Improved Test Power Optimization Method by Insertion of Linear Functions

Power Management during Scan Based Sequential Circuit Testing

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

A low power architecture based on unidirectional cut

A Scan Segmentation Architecture for Power Controllability and Reduction

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

A Unified Solution to Reduce Test Power and Test Volume for Test-per-scan Schemes

Test Pattern Generation Based On Multi-Trc Scan Architecture For Reducing Test Cost

A scan chain optimization method for diagnosis

Improving test effectiveness of scan-based BIST by scan chain partitioning

Reconfigured Scan Forest For Test Application Cost, Test Data Volume, And Test Power Reduction

An Novel Solution for Testing Power and Testing Time