Abstract:With the reduced noise margin brought by relentless technology scaling, power integrity assurance has become more challenging than ever. On the other hand, traditional design methodologies typically focus on a single design layer without much cross-layer interaction, potentially introducing unnecessary guard-band and wasting significant design resources. Both issues imperatively call for a cross-layer framework for the co-exploration of power delivery (PD) and system architecture, especially at early design stage with larger design freedom. Unfortunately, such a framework does not exist yet in the literature. As a step forward, this paper provides a run-time simulation framework of both PD and architecture and captures their interactions. Enabled by the proposed recursive run-time PD model, it handles an entire PD system on-the-fly simulation with <1% deviation from SPICE. Moreover, with a seamless interaction among architecture, power and PD simulators, it has the capability to simulate benchmarks with millions of cycles within reasonable time. A support vector regression (SVR) model is employed to further speed up power estimation of functional units to millions cycle/second with good accuracy. The experimental results of running PARSEC suite have illustrated the framework's capability to explore hardware configurations to discover the co-effect of PD and architecture for early stage optimization. Moreover, it also illustrates multiple over-pessimisms in traditional methodologies.

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

A low power architecture based on unidirectional cut

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

Low-power Technique of Scan-Based Design for Test

Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture.

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

Localizing Test Power Consumption for Scan Testing

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Reconfigured Scan Forest For Test Application Cost, Test Data Volume, And Test Power Reduction

Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing

A Scan Segmentation Architecture for Power Controllability and Reduction

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment

A New Test Data Compression Scheme for Multi-scan Designs.

A novel cross-layer framework for early-stage power delivery and architecture co-exploration.

Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing.

A Unified Solution to Scan Test Volume, Time, and Power Minimization