Abstract:The increasing power consumption during the chip testing process has become the bottleneck of chip production and testing for micro-nano VLSI circuits. Numerous low power design-for-testability (DfT) techniques have been proposed to deal with the test power problem, and segmented scan method was shown to be an efficient solution. We propose a new poweraware scan segment architecture, which can accurately control the power of shift and capture cycles at the same time. Since enabling only a subset of scan flip-flops to capture test responses in one cycle compromises the fault coverage, we propose a new method to reduce the fault coverage loss. First, we use a more accurate notion, spoiled nodes, instead of violation edges used in previous works to analyse the ependency of flip-flops, then we use simulated annealing(SA) mechanism to find the best combination of these flip-flops while considering the clock trees' impact. To the best of our knowledge, this is the first work to make shift and capture power in a controllable way with minimum fault coverage loss, small test-data volume and no extra hardware overhead for at-speed transition fault test. Extensive experiments have been performed on reference circuit ISCAS89 and IWLS2005 to verify the effectiveness of the proposed method.

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

Reconfigured Scan Forest For Test Application Cost, Test Data Volume, And Test Power Reduction

Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing

Scan-based BIST using an improved scan forest architecture

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

A scan chain optimization method for diagnosis

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

BIST Technique Based on the Scan Forest Architecture

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects

A Unified Solution to Scan Test Volume, Time, and Power Minimization

Low-power Technique of Scan-Based Design for Test

Partial Scan Design Based on Circuit State Information

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

Improving test effectiveness of scan-based BIST by scan chain partitioning