Abstract:It is known that the complexity of automatic test pattern generation (ATPG) for acyclic sequential circuits is similar to that of combinational ATPG. The general problem, however, requires time-frame expansion and multiple-fault detection and hence does not allow the use of available combinational ATPG programs. The first contribution of this work is a combinational single-fault ATPG method for the most general class of acyclic sequential circuits. Without inserting any real hardware, we create a functionally equivalent “balanced” ATPG model of the circuit in which all reconverging paths have the same sequential depth. Some primary inputs and gates are duplicated in this model, which is converted into a combinational circuit by shorting all flip-flops. A test vector obtained by a combinational ATPG program for a fault in this combinational circuit is transformed into a test sequence to detect a corresponding fault in the original sequential circuit. A combinational ATPG program finds tests for all but a small set of faults that must be explicitly detected as multiple-faults. Those are modeled for ATPG using the second contribution of this work, which is a generalized method to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most $n+3$ modeling gates for a fault of multiplicity $n$. We show that the modeled circuit is functionally equivalent to the original circuit and the targeted multiple fault is equivalent to the modeled single stuck-at fault. Benchmark results show at least an order of magnitude saving in the ATPG CPU time by the new combinational method over sequential ATPG.

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

Test compaction for small-delay defects using an effective path selection scheme

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

Combinational automatic test pattern generation for acyclic sequential circuits

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.

Sequential circuit ATPG using combinational algorithms

Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing

Compact Test Generation with an Influence Input Measure for Launch-On-Capture Transition Fault Testing

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction

Segment Based X-Filling for Low Power and High Defect Coverage

A scan chain optimization method for diagnosis

Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure

Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power