Abstract:This paper presents a new method for improving transition fault coverage in hybrid scan testing. It is based on a novel test application scheme, in order to break the functional dependence of broadside testing. The new technique analyzes the automatic test pattern generation conflicts in broadside test generation and skewed-load test generation, and tries to control the flip-flops with the most influence on fault coverage. The conflict-driven selection method selects some flip-flops that work in the enhanced scan mode or skewed-load scan mode. And the conflict-driven reordering method distributes the selected flip-flops into different chains. In the multiple scan chain architecture, to avoid too many scan-in pins, some chains are driven by the same scan-in pin to construct a tree-based architecture. Based on the architecture, the new test application scheme allows some flip-flops to work in enhanced scan or skewed-load mode, while most of others to work in the traditional broadside scan mode. With the efficient conflict-driven selection and reordering schemes, fault coverage is improved greatly, which can also reduce test application time and test data volume. Experimental results show that fault coverage based on the proposed method is comparable that of enhanced scan.

Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure

Compact Test Generation with an Influence Input Measure for Launch-On-Capture Transition Fault Testing

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

Test compaction for small-delay defects using an effective path selection scheme

Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.

Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

An improved method for test chip design

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

Non-scan testability based on fault-oriented conflict analysis

Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects

A Novel Hybrid Delay Testing Scheme with Low Test Power, Volume, and Time

A scan chain optimization method for diagnosis

Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution