Abstract:Fault simulation is a critical component of the automatic test pattern generation (ATPG) tool, which is widely used in chip development. The CPU–GPU heterogeneous system can accelerate fault simulation. However, existing work faces the following challenges: 1) Path Divergence: The simulation path of different faults is not uniform, which leads to low parallel efficiency of different GPU threads; 2) Unbalanced Workload: The load of different computing units is not balanced, leading to serious differences in the execution time of each part; and 3) Poor Scalability: When the circuit scale increases, the GPU memory is limited and the simulation has strong structural dependence, which makes the simulation difficult. In this work, we propose an adaptive multidimensional parallel fault simulation framework based on the CPU–GPU heterogeneous system. We adaptively select different simulation approaches according to different circuit scales. In detail, we use the fanout-free region (FFR) grouping method to solve the problem of path divergence. We also use a combination of static and dynamic load balancing to tradeoff data handling and the execution time of each computing unit. We limit the queue length used in the GPU to improve the scalability of the simulation. To further accelerate, we propose the 4-D parallel architecture on multiple GPUs. Extensive experimental results show that our fault simulator based on 8 GPU is $105.7\times $ faster than the commercial tool on average. For tens of millions of gate-level circuits, our fault simulator based on one GPU is up to $25.9\times $ faster than the CPU single-threaded simulator.

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

Analog Circuit Fault Simulation Approach Based on Pspice Engine

Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.

Analog Circuit Simulation Approach with Multi-Fault Injector

Test compaction for small-delay defects using an effective path selection scheme

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

FSimGEO: a Test Generation Method for Path Delay Fault Test Using Fault Simulation and Genetic Optimization

Adaptive Multidimensional Parallel Fault Simulation Framework on Heterogeneous System

A Fast Simulation Method for Evaluating the Single-Event Effect in Aerospace Integrated Circuits

An improved method for test chip design

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects

A scan chain optimization method for diagnosis

Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing

On Full Path Delay Fault Testability of Combinational Circuits

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Fast Simulation of Interconnect-Dominant Circuits

HDL-Mutation Based Simulation Data Generation by Propagation Guided Search