Abstract:The increasing power consumption during the chip testing process has become the bottleneck of chip production and testing for micro-nano VLSI circuits. Numerous low power design-for-testability (DfT) techniques have been proposed to deal with the test power problem, and segmented scan method was shown to be an efficient solution. We propose a new poweraware scan segment architecture, which can accurately control the power of shift and capture cycles at the same time. Since enabling only a subset of scan flip-flops to capture test responses in one cycle compromises the fault coverage, we propose a new method to reduce the fault coverage loss. First, we use a more accurate notion, spoiled nodes, instead of violation edges used in previous works to analyse the ependency of flip-flops, then we use simulated annealing(SA) mechanism to find the best combination of these flip-flops while considering the clock trees' impact. To the best of our knowledge, this is the first work to make shift and capture power in a controllable way with minimum fault coverage loss, small test-data volume and no extra hardware overhead for at-speed transition fault test. Extensive experiments have been performed on reference circuit ISCAS89 and IWLS2005 to verify the effectiveness of the proposed method.

Segment Based X-Filling for Low Power and High Defect Coverage

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing.

An improved X-filling strategy based on the Multilayer Data Copy scheme for test data and power reduction for SoC

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

Compression-aware Capture Power Reduction for At-Speed Testing

A Scan Segmentation Architecture for Power Controllability and Reduction

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

Low-power Technique of Scan-Based Design for Test

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A scan chain optimization method for diagnosis

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

A Unified Solution to Reduce Test Power and Test Volume for Test-per-scan Schemes

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment

IPF: In-Place X-Filling to Mitigate Soft Errors in SRAM-Based FPGAs.