Abstract:With the rapidly increasing test time of semiconductor testing, the trend is currently toward improving test parallelism by exploiting multi-site testing. However, excessive test I/O channels and test power consumption lead to the degradation of multi-site testing efficiency owing to the limited number of tester I/Os and power capacity. In this paper, we present an advanced low pin count test architecture for efficient multi-site testing in semiconductors. To achieve this, the scan chain routing method is first exploited to reduce the power consumption during scan-based testing through a cluster-based approach, which is compatible with the test compression architecture. Subsequently, a new test compression architecture is proposed to encode test patterns and enable the testing of each device-under-test (DUT) through a low input test pin count by using the unique properties of the proposed tri-state detector and boundary scan architecture. The experimental results show the decrease in the test I/O requirements and test power consumption. Based on these improvements, the test application time (TAT) was significantly reduced for ISCAS'89 and IWLS'05 OpenCores benchmark circuits compared to the previous methods, without a heavy burden on the additional H/W area and routing overhead.

An improved X-filling strategy based on the Multilayer Data Copy scheme for test data and power reduction for SoC

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

An Improved Test Power Optimization Method by Insertion of Linear Functions

Low Power Multistage Test Data Compression Scheme

A New Test Data Compression Scheme for Multi-scan Designs.

Improved Data Compression Scheme for Multi-Scan Designs

Segment Based X-Filling for Low Power and High Defect Coverage

Compression-aware Capture Power Reduction for At-Speed Testing

Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping

Reduction of test power and data volume in BIST scheme based on scan slice overlapping

A Power Efficient Test Data Compression Method for SoC Using Alternating Statistical Run-Length Coding

Effective Design Method to Reduce SCAN Test Application Time of SOC's

Partition-based Low Power DFT Methodology for System-on-chips

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A Scan Design Method Based on Two Complementary Connection Styles to Minimize Test Power

Improve Test Compression Ratio and Reduce Test Power of EFDR Codes by Scan Chain Reconfiguration

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

A novel approach to drastic test data compression for multiple scan designs

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering