Abstract:Due to the reduction in transistor size, test engineers face a severe issue in power minimization. VLSI circuit's power dissipation has become a vital concern due to the switching activity of the Circuit Under Test (CUT). Switching activity is a significant factor in determining power consumption for CMOS VLSI circuits. In this paper, we formulate a distance estimation technique and reordering using the Tversky index. Here, the distance between the test vectors is calculated using the Tversky index with the formation of an adjacency matrix, and reordering is performed. The experimental results of the proposed method have been compared to different distance measures and existing techniques. It shows that the switching activity is reduced from 52.5% to 21.5%, and the average power reduction is from 42% to 14.6% when the distance is estimated on reordering using the Tversky index measure. Thus, the Tversky index distance measure performs better than the Hamming, gray, and Linear feedback shift register (LFSR) methods. Switching activity estimation for complex ISCAS circuits has been performed and compared with existing methods for superior performance. We have also developed a Built in Self-Test (BIST) for the C17 benchmark circuit, which uses the Tversky counter as a test pattern generator using the TANNER EDA tool. Thus, an efficient deterministic BIST for the C17 benchmark circuit was designed to detect all the stuck-at faults, and the same procedure can be used to create BIST for all CUT and precomputed test sets for real-time field testing.

Reduction of test power and data volume in BIST scheme based on scan slice overlapping

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

Improving test effectiveness of scan-based BIST by scan chain partitioning

Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan Arhcitecture

Test Power Reduction through Reordering Algorithm Implementation and Advancements in BIST Architecture

Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning

An Novel Solution for Testing Power and Testing Time

Scan-based BIST using an improved scan forest architecture

Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST

RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

Scan BIST with Biased Scan Test Signals

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Improve Test Compression Ratio and Reduce Test Power of EFDR Codes by Scan Chain Reconfiguration

A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

Low-power Weighted Random Pattern Testing

Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding

A Power Efficient Test Data Compression Method for SoC Using Alternating Statistical Run-Length Coding

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

A New Test Data Compression Scheme for Multi-scan Designs.