Abstract:The increasing power consumption during the chip testing process has become the bottleneck of chip production and testing for micro-nano VLSI circuits. Numerous low power design-for-testability (DfT) techniques have been proposed to deal with the test power problem, and segmented scan method was shown to be an efficient solution. We propose a new poweraware scan segment architecture, which can accurately control the power of shift and capture cycles at the same time. Since enabling only a subset of scan flip-flops to capture test responses in one cycle compromises the fault coverage, we propose a new method to reduce the fault coverage loss. First, we use a more accurate notion, spoiled nodes, instead of violation edges used in previous works to analyse the ependency of flip-flops, then we use simulated annealing(SA) mechanism to find the best combination of these flip-flops while considering the clock trees' impact. To the best of our knowledge, this is the first work to make shift and capture power in a controllable way with minimum fault coverage loss, small test-data volume and no extra hardware overhead for at-speed transition fault test. Extensive experiments have been performed on reference circuit ISCAS89 and IWLS2005 to verify the effectiveness of the proposed method.

Improve Test Compression Ratio and Reduce Test Power of EFDR Codes by Scan Chain Reconfiguration

RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

A Power Efficient Test Data Compression Method for SoC Using Alternating Statistical Run-Length Coding

Test Data Compression for System-on-Chip Using Advanced Frequency-Directed Run-Length(AFDR) Codes

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A Power Efficient Test Data Compression Method on Count Compatible PRL Coding

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

Reconfigured Scan Forest For Test Application Cost, Test Data Volume, And Test Power Reduction

A scan chain optimization method for diagnosis

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Reduction of test power and data volume in BIST scheme based on scan slice overlapping

Reconfigured Test Architecture Optimization For Tsv-Based Three-Dimensional Socs

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

A New Test Data Compression Scheme for Multi-scan Designs.

Compact Test Generation with an Influence Input Measure for Launch-On-Capture Transition Fault Testing

Improved Data Compression Scheme for Multi-Scan Designs

A Unified Solution to Scan Test Volume, Time, and Power Minimization