A Unified Solution to Scan Test Volume, Time, and Power Minimization

Zhen Chen,Sharad Seth,Dong Xiang,Bhargab B. Bhattacharya
DOI: https://doi.org/10.1109/vlsi.design.2010.44
2010-01-01
Abstract:The double-tree scan-path architecture, originally proposed for low test power, is adapted to simultaneously reduce the test application time and test data volume under external testing. Experimental results show significant performance improvements over other existing scan architectures.
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