Abstract:In this paper, we present a new test data compression scheme for multi-scan designs to reduce the test data volume and thus the test cost. The proposed method achieves the target in two steps. First a drive bit matrix with less columns is generated by exploiting the compatibilities between the columns of the initial scan bit matrix, as well as the inverse compatibilities and the logic dependencies between the columns of the mid bit matrices. Then a dictionary bit matrix with limited rows is constructed, having the properties that for each row of the drive bit matrix a compatible row exists or can be generated by an XOR operation on multiple rows in the dictionary bit matrix, and the total numbers of rows in the dictionary bit matrix used to compute all the compatible rows is minimal. The rows in the dictionary matrix are encoded to further reduce the number of ATE channels and the test data volume. The experimental results for the large ISCAS 89 benchmarks show that the proposed method significantly reduces test data volume for multi-scan designs.

Test Data Compression for System-on-Chip Using Advanced Frequency-Directed Run-Length(AFDR) Codes

A Test Data Compression Method for System-on-a-Chip

Test data compression using extended frequency-directed run length code based on compatibility

Compression Method Based on Test Vector Compatibility

An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture.

Data Compression and Storage under High Speed Network

A Power Efficient Test Data Compression Method for SoC Using Alternating Statistical Run-Length Coding

Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

Bit Stream Compression Using Self-Adaptive Efdr Coding

A Test Set Compression Algorithm Based on PTIDR Code

VSPTIDR: A novel code for test compression of SoC

A Power Efficient Test Data Compression Method on Count Compatible PRL Coding

A Compressive-sensing based Testing Vehicle for 3D TSV Pre-bond and Post-bond Testing Data.

A new test data compression/decompression scheme to reduce SOC test time

RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power

A New Test Data Compression Scheme for Multi-scan Designs.

Test Resource Partitioning Using PTIDR Code

Improved Data Compression Scheme for Multi-Scan Designs

Improve Test Compression Ratio and Reduce Test Power of EFDR Codes by Scan Chain Reconfiguration

Compact Test Generation with an Influence Input Measure for Launch-On-Capture Transition Fault Testing

The Algorithm of Filling X Bits in Dual-Run-Length Coding