Abstract:In this paper, we present a new test data compression scheme for multi-scan designs to reduce the test data volume and thus the test cost. The proposed method achieves the target in two steps. First a drive bit matrix with less columns is generated by exploiting the compatibilities between the columns of the initial scan bit matrix, as well as the inverse compatibilities and the logic dependencies between the columns of the mid bit matrices. Then a dictionary bit matrix with limited rows is constructed, having the properties that for each row of the drive bit matrix a compatible row exists or can be generated by an XOR operation on multiple rows in the dictionary bit matrix, and the total numbers of rows in the dictionary bit matrix used to compute all the compatible rows is minimal. The rows in the dictionary matrix are encoded to further reduce the number of ATE channels and the test data volume. The experimental results for the large ISCAS 89 benchmarks show that the proposed method significantly reduces test data volume for multi-scan designs.

Test Resource Partitioning Using PTIDR Code

A Test Set Compression Algorithm Based on PTIDR Code

VSPTIDR: A novel code for test compression of SoC

Test Data Compression for System-on-Chip Using Advanced Frequency-Directed Run-Length(AFDR) Codes

A Test Data Compression Method for System-on-a-Chip

A DCT Coding Method Based on Edge Information Measure and Adaptive Segmentation

A Power Efficient Test Data Compression Method on Count Compatible PRL Coding

Compression Method Based on Test Vector Compatibility

P4CTM: Compressed Traffic Pattern Matching Based on Programmable Data Plane

Data Compression and Storage under High Speed Network

Test data compression using extended frequency-directed run length code based on compatibility

A Compressive-sensing based Testing Vehicle for 3D TSV Pre-bond and Post-bond Testing Data.

Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

A Power Efficient Test Data Compression Method for SoC Using Alternating Statistical Run-Length Coding

A new test data compression/decompression scheme to reduce SOC test time

An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture.

Test Data Compression for System-on-chip Using Flexible Runs-aware PRL Coding.

RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power

A New Test Data Compression Scheme for Multi-scan Designs.

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

Circuit Partitioning Based Fingerprinting Method for IP Protection