Abstract:With the rapidly increasing test time of semiconductor testing, the trend is currently toward improving test parallelism by exploiting multi-site testing. However, excessive test I/O channels and test power consumption lead to the degradation of multi-site testing efficiency owing to the limited number of tester I/Os and power capacity. In this paper, we present an advanced low pin count test architecture for efficient multi-site testing in semiconductors. To achieve this, the scan chain routing method is first exploited to reduce the power consumption during scan-based testing through a cluster-based approach, which is compatible with the test compression architecture. Subsequently, a new test compression architecture is proposed to encode test patterns and enable the testing of each device-under-test (DUT) through a low input test pin count by using the unique properties of the proposed tri-state detector and boundary scan architecture. The experimental results show the decrease in the test I/O requirements and test power consumption. Based on these improvements, the test application time (TAT) was significantly reduced for ISCAS'89 and IWLS'05 OpenCores benchmark circuits compared to the previous methods, without a heavy burden on the additional H/W area and routing overhead.

Compression-aware Capture Power Reduction for At-Speed Testing

A Compressive-sensing based Testing Vehicle for 3D TSV Pre-bond and Post-bond Testing Data.

Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment

Compact Test Generation with an Influence Input Measure for Launch-On-Capture Transition Fault Testing

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A Power Efficient Test Data Compression Method on Count Compatible PRL Coding

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

A Power Efficient Test Data Compression Method for SoC Using Alternating Statistical Run-Length Coding

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

A new test data compression/decompression scheme to reduce SOC test time

Low-capture-power At-Speed Testing Using Partial Launch-on-capture Test Scheme

Test Data Compression for System-on-Chip Using Advanced Frequency-Directed Run-Length(AFDR) Codes

Non-intrusive Test Compression for SOC Using Embedded FPGA Core

Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing.

An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture.

A New Test Data Compression Scheme for Multi-scan Designs.

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Prediction of Compression Bound and Optimization of Compression Architecture for Linear Decompression-Based Schemes

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

VSPTIDR: A novel code for test compression of SoC