Abstract:With the rapidly increasing test time of semiconductor testing, the trend is currently toward improving test parallelism by exploiting multi-site testing. However, excessive test I/O channels and test power consumption lead to the degradation of multi-site testing efficiency owing to the limited number of tester I/Os and power capacity. In this paper, we present an advanced low pin count test architecture for efficient multi-site testing in semiconductors. To achieve this, the scan chain routing method is first exploited to reduce the power consumption during scan-based testing through a cluster-based approach, which is compatible with the test compression architecture. Subsequently, a new test compression architecture is proposed to encode test patterns and enable the testing of each device-under-test (DUT) through a low input test pin count by using the unique properties of the proposed tri-state detector and boundary scan architecture. The experimental results show the decrease in the test I/O requirements and test power consumption. Based on these improvements, the test application time (TAT) was significantly reduced for ISCAS'89 and IWLS'05 OpenCores benchmark circuits compared to the previous methods, without a heavy burden on the additional H/W area and routing overhead.

Low-capture-power At-Speed Testing Using Partial Launch-on-capture Test Scheme

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

Compact Test Generation with an Influence Input Measure for Launch-On-Capture Transition Fault Testing

Compression-aware Capture Power Reduction for At-Speed Testing

A low power architecture based on unidirectional cut

Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing.

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture.

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

MVP: Capture-Power Reduction with Minimum-Violations Partitioning for Delay Testing

Partition-based Low Power DFT Methodology for System-on-chips

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Partial Scan Design Against Scan-Based Side Channel Attacks.

A Low Power Built-In Self-Test Scheme Based on Overlapping Bit Swapping Linear Feedback Shift Register