Abstract:For a large circuit under test (CUT), it is likely that some test patterns result in excessive power dissipations that exceed the CUT's power rating. Designers may resort to low-power automatic test pattern generation (ATPG) tools to solve this problem, which, however, usually leads to larger test data volume and requires extra computational effort, even if such tools are available. Another method is to partition the circuit into multiple subcircuits and test them separately. Unfortunately, this usually involves rerunning the time-consuming ATPG for each partitioned subcircuit and solving the problem of how to achieve an acceptable fault coverage for the glue logic between subcircuits. In this paper, we propose a novel low-power virtual test partitioning technique without the above-mentioned shortcomings. The basic idea is to partition the circuit in such way that the faults in the glue logic between subcircuits can be detected by patterns with low power dissipation that are applied at the entire circuit level, while the patterns with high power dissipation can be applied within a partitioned subcircuit without loss of fault coverage. Scan chain routing cost has also been considered during the partitioning process. Experimental results show that the proposed technique is very effective in reducing test power.

MVP: Capture-Power Reduction with Minimum-Violations Partitioning for Delay Testing

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

Pattern-directed Circuit Virtual Partitioning for Test Power Reduction

Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing.

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

A Novel Hybrid Delay Testing Scheme with Low Test Power, Volume, and Time

A Unified Solution to Scan Test Volume, Time, and Power Minimization

A Unified Solution to Reduce Test Power and Test Volume for Test-per-scan Schemes

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

A Scan Segmentation Architecture for Power Controllability and Reduction

An Effective Method To Reduce Test Power Dissipation

A low power architecture based on unidirectional cut

A Scan Design Method Based on Two Complementary Connection Styles to Minimize Test Power

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

Compression-aware Capture Power Reduction for At-Speed Testing