Abstract:The increasing power consumption during the chip testing process has become the bottleneck of chip production and testing for micro-nano VLSI circuits. Numerous low power design-for-testability (DfT) techniques have been proposed to deal with the test power problem, and segmented scan method was shown to be an efficient solution. We propose a new poweraware scan segment architecture, which can accurately control the power of shift and capture cycles at the same time. Since enabling only a subset of scan flip-flops to capture test responses in one cycle compromises the fault coverage, we propose a new method to reduce the fault coverage loss. First, we use a more accurate notion, spoiled nodes, instead of violation edges used in previous works to analyse the ependency of flip-flops, then we use simulated annealing(SA) mechanism to find the best combination of these flip-flops while considering the clock trees' impact. To the best of our knowledge, this is the first work to make shift and capture power in a controllable way with minimum fault coverage loss, small test-data volume and no extra hardware overhead for at-speed transition fault test. Extensive experiments have been performed on reference circuit ISCAS89 and IWLS2005 to verify the effectiveness of the proposed method.

Partial Scan Design Based on Circuit State Information

Partial Scan Design Based on Circuit State Information and Functional Analysis

A Multiple Phase Partial Scan Design Method

A scan chain optimization method for diagnosis

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Partial Reset for Synchronous Sequential Circuits Using Almost Independent Reset Signals

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis

Low-power Technique of Scan-Based Design for Test

Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture.

A low power architecture based on unidirectional cut

Power Management during Scan Based Sequential Circuit Testing

Scan BIST with Biased Scan Test Signals

Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning

Effective Design Method to Reduce SCAN Test Application Time of SOC's

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost