Abstract:Scan tree architecture has been proposed to reduce the test application time of full scan chain by placing multiple scan cells in parallel. Most existing techniques rely on non-compact test pattern sets to construct the scan tree. However, they produce inefficient scan tree when highly compact test sets with few don't cares are used. In this paper, the depth of the scan tree based on approximate compatibility relation for completely specified test data set is analyzed probabilistically by modeling its construction as a vertex coloring problem. The upper bound of edges-per-vertex is computed and demonstrated to be a prime factor that limits the efficiency of scan tree construction based on both compatible and approximately compatible test data between two flip-flops. Inverse compatibility and aggressive approximate compatibility are then proposed to increase the edges-per-vertex for vertex coloring. The Q'-SD connection between two adjacent scan cells is exploited to implement the inverse compatibility with no cost or timing impact. To maintain the fault coverage, the missing faults under the tree scan mode can be detected by switching the same base architecture into the linear scan mode with negligible hardware overhead as shown by the experimental results on ISCAS89, ISCAS99 and LGSynth93 benchmark circuits. On average, the scan tree generated by our method reduces the test time of the full scan chain by 56.65 percent, and that of the scan tree designed by the approximate compatibility method by 39.18 percent under the same compact test sets.

Partial Scan Design Based on Circuit State Information

Partial Scan Design Based on Circuit State Information and Functional Analysis

A Multiple Phase Partial Scan Design Method

A scan chain optimization method for diagnosis

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

Balancing Testability and Security by Configurable Partial Scan Design.

Partial Scan Design Against Scan-Based Side Channel Attacks.

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

A Scan Design Method Based on Two Complementary Connection Styles to Minimize Test Power

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Partial Reset for Synchronous Sequential Circuits Using Almost Independent Reset Signals

Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction

A power-efficient scan tree design by exploring the Q'-D connection.

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis

New algorithm for retiming-based partial scan

Low-power Technique of Scan-Based Design for Test

Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis

A Unified Solution to Reduce Test Power and Test Volume for Test-per-scan Schemes

An Area-Efficient Scannable <i>In Situ</i> Timing Error Detection Technique Featuring Low Test Overhead for Resilient Circuits