Abstract:Logic built-in self-test and scan-based testability design are currently the mainstream solutions for large-scale integrated circuit testing. Phase shifters are widely used in these testing schemes because they can greatly improve the driving ability of test inputs and significantly improve the fault coverage of testing. A phase shifter is composed of an XOR network consisting of a certain number of multi-input XOR gates, and the correlation of the output sequence of the phase shifter has a significant impact on the testing performance. The classic constructing method of phase shifters has problems such as long running time, easy wiring conflicts during the actual synthesis and implementation of final circuits. Therefore, when encountering designs with large scanning units, they often face great difficulties. This article proposes a phase shifter constructing method based on grouping and random fan-in, which controls the register units that each scan chain excitation input depends on as much as possible within a local range, greatly reducing the computational time and wiring difficulty of phase shifter construction. At the same time, a linear feedback shift register bit with random fan-in is introduced to reduce the correlation between the output sequences of adjacent ports of the phase shifter. Using partial IWLS 2005 benchmark circuits and OpenCores test circuits, while ensuring the same test fault coverage for stuck-at faults and transition faults, this method reduces more than 30% running time to construct a phase shifter compared to classical methods. The phase shifter structures constructed for each test circuit are synthesized and implemented on Xilinx’s XC7V690T FPGA. The phase shifter constructed by this method consumes more than 20% less wiring resources than the phase shifter constructed by classical methods.

A Multiple Phase Partial Scan Design Method

Partial Scan Design Based on Circuit State Information and Functional Analysis

Partial Scan Design Based on Circuit State Information

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A scan chain optimization method for diagnosis

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

A Fast Method for Constructing Phase Shifters to Reduce Wiring Conflicts

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

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Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis

Partial Reset for Synchronous Sequential Circuits Using Almost Independent Reset Signals

Non-scan design for testability for mixed RTL circuits with both data paths and controller via conflict analysis

Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture.

Improving test effectiveness of scan-based BIST by scan chain partitioning

Effective Design Method to Reduce SCAN Test Application Time of SOC's

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost