Abstract:Scan chain design facilitates chip testing by providing an interface for the test engineers to access and control the internal states of the circuit. This feature has also been exploited to break systems such as the cryptographic chips by the attack known as scan chain side channel analysis. From the perspective of information access, test engineers and scan chain attackers have the same goal - observe and control the scan chain side channel information. Consequently, all the existing countermeasures have to make the tradeoff between scan chain security and the testability it can provide. In this paper, we propose a novel public-private partial scan chain design which can deliver both full testability and security. The key idea is to partition the flip flops into a public partial chain and a set of parallel private partial chains. The private partial chains are protected by means of a hardware implemented finite state machine and an obfuscation mechanism based on configurable physical unclonable function. We demonstrate how full testability can be achieved by the proposed public-private partial chains. We conduct security and performance analysis to show that our approach is robust against all the known scan chain based attacks and can improve testing time and power consumption with negligible hardware overhead.

Non-scan design for testability for mixed RTL circuits with both data paths and controller via conflict analysis

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis

Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution

Non-Scan Design for Testability for Synchronous Sequential Circuits Based on Conflict Analysis

Accelerating RTL Quality Assessment Method Based on CAD Tools

Non-scan testability based on fault-oriented conflict analysis

Design of Mixed-Signal Circuit for Testability

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

Handling the Pin Overhead Problem of DFTs for High-Quality and At-Speed Tests

Partial Scan Design Based on Circuit State Information and Functional Analysis

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

A Multiple Phase Partial Scan Design Method

A scan chain optimization method for diagnosis

An improved method for test chip design

Balancing Testability and Security by Configurable Partial Scan Design.

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

A Scan Design Method Based on Two Complementary Connection Styles to Minimize Test Power

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

A Design for Testability Approach for Nano-Cmos Analogue Integrated Circuits

Application Dependent FPGA Interconnect Test Method with Small Test Configuration Number Using SMT Net-Grouping Constraints