Abstract:enough. However, the complications associated with IP from different sources, having incompatible test strategies and requiring several types of testers, make a difficult situation nearly impossible. The answer is to build at least some of the test hardware on-chip. Ideally, a DFT technology should scale to larger devices so that common test approaches can be used across several designs. Test hardware can be straightforward IEEE 1149.1 scan logic or complex and application-specific, built-in self-test (BIST) circuitry. When the DUT is placed in a special test mode, scan logic reconfigures a device's latches into serial shift registers. Predetermined test vectors then can be shifted into the DUT, a test executed, and the test results shifted out for analysis. BIST may use the same 1149.1 test access port (TAP) pins for control, but vector generation and analysis are provided on-chip by the BIST test circuitry. Different BIST schemes are appropriate for logic, memory, and some special functions such as analog-to-digital converters (ADCs) and digital-to-analog converters (DACs) and phase-locked loops (PLLs). A New design tools make it easy to include the right level of DFT with minimal overhead. Courtesy of Teradyne ntil recently, design for testability (DFT) had almost perfectly exemplified the conjunction of incongruous or contradictory terms: it was an oxymoron. Semiconductor companies acknowledged that they ranked DFT with unsettling concepts such as qualified success and deafening silence, but designing in testability always had been difficult. Consequently, manufacturers often solved the problem of reconciling design and test by avoiding it. The fact that the situation has changed is as remarkable as the cause. For many years, larger and faster ICs required larger and faster and more expensive ATE. The growth of the system on a chip (SOC) business has leapfrogged any possibility of continuing to follow this established test paradigm. Instead of IC size simply increasing each year by perhaps a million gates and a few more pins, SOCs today may integrate as many as 30 to 60 different intellectual property (IP) cores on a single chip. And, SOCs ignore the traditional segregation of memory, logic, and analog functions. Being faced with the need to test the very large chips that result from such an IP combination is bad

Handling the Pin Overhead Problem of DFTs for High-Quality and At-Speed Tests

An improved method for test chip design

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Non-scan design for testability for mixed RTL circuits with both data paths and controller via conflict analysis

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

A scan chain optimization method for diagnosis

DfT optimization for pre-bond testing of 3D-SICs containing TSVs

Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST

Low-capture-power At-Speed Testing Using Partial Launch-on-capture Test Scheme

Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill

New Dft Architectures for 3D-Sics with A Wireless Test Port

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths

FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

Design for Testability Design Test Test Development Failure Diagnosis the Multiple Facets of Dft Figure 1. Closing the Dft Gap