An Overview of JTAG Technology: Development and Application

Zhihua Wang

IF: 1.992

2005-01-01

Microelectronics Journal

Abstract:As an IEEE test standard,JTAG is accepted and used by many IC design companies and manufacturers.The application of JTAG in printed circuit board is described.The latest development of JTAG technology and its applications in signal integrity test,embedded test and differential signal test are discussed in particular.

What problem does this paper attempt to address?

A novel on-chip debug system with quick all-registers scan chain based on JTAG

Yang Liu,WangHua Wu,Xiaofang Zhou,Dian Zhou

DOI: https://doi.org/10.1109/ICSICT.2006.306535

2007-01-01

Abstract:JTAG defines a serial interface to access test-dedicated logic embedded in integrated circuits. As an extension, a test platform based on JTAG standard can support general verifications and debug functions for SOC. The paper presents an on-chip debug system based on JTAG standard for embedded microprocessors. It provides powerful functions for the system. For example, hardware breakpoints, single step execution mode, monitoring the registers, programming.An all-registers structure is used to support quick all-registers monitoring functions. Moreover, the paper contributes to the research of no-gap transfer of debug functions ©2006 IEEE.
A JTAG Standard-based Test Circuit Design for SOC System

虞志益,雷健飞,李文宏,章倩苓

DOI: https://doi.org/10.3969/j.issn.1000-3819.2003.01.013

2003-01-01

Abstract:Along with the more complicated integrated circuit system and the emergence of IP-based SOC system, the test of IC system becomes more difficult and faces new challenge. In this paper we design a JTAG-based test circuit design after studying some important kinds of test techniques. It embraces some different test techniques at the little cost of the circuit complexity and overcomes some difficult issues in the test of IP-bases SOC system. We also give the test strategy based on this circuit.
A SOC Test Circuit Design and Implement Based on JTAG

Guoqiang Bai

2009-01-01

Abstract:In this paper,a new test method was presented.This method was based on JTAG protocol.The JTAG instructions were extended and the extended test instructions can be download to SOC through JTAG.The test results can be also feedback through JTAG.The IP and memory in SOC design can be well tested.The test process can be configured flexibly,and the problem occurred in test can be fixed rapidly.
Design and implementation of a PCB testing system

李江波,潘雪增,平玲娣

DOI: https://doi.org/10.3785/j.issn.1008-973X.2001.06.006

2001-01-01

Abstract:The product test of PCB (printed circuit board), which checks the open circuit, short circuit, line cauterization and so on, is very important. It ensures the product quality and affects the cost of the PCB. A PCB test system integrates the testing point generation, testing-point linking and blueprint generation into one system. This paper deals with the design and implementation of a PCB testing system, especially the key algorithms in the implementation of the automatic testing point linking and the optimization of sequence strings' location. The algorithm of testing point linking cab improve the product quality and speedup the testing point linking process. The optimization algorithm of sequence strings' location can search the interspace of a linking graph automatically.
ARM DEBUGGER BASED ON JTAG

Lu Han,Pan Xuezeng,Ping Lingdi

DOI: https://doi.org/10.3969/j.issn.1000-386X.2007.02.048

2007-01-01

Abstract:With the popularity of the uClinux system,it became very important to port and debug the uClinux system on Linux.In this paper,we will introduce a cheap resolvent based on JTAG and GDB,which can give better support for porting and debugging the uClinux system.
The Algorithm and Implementation of a Universal PCB Testing System

LI Jiang-Bo,PAN Xue-zeng,PING Ling-di

DOI: https://doi.org/10.3969/j.issn.1006-5911.2001.06.013

2001-01-01

Computer Integrated Manufacturing Systems

Abstract:The testing of a PCB (Printed Circuit Board)is very important to produce PCB. It affects the qulity and the cost of PCB. This paper mainly discusses the designing and implementation of PCB testing system, especially the key algorithms in the implementation of netlist generation and testing point auto generation module.
A Method of Embedded Debug Interface Based on JTAG Protocol

Hai-liang YOU,Hai-tong GE,Xiao-lang YAN

DOI: https://doi.org/10.3969/j.issn.1671-7147.2007.05.005

2007-01-01

Abstract:A new design method for embedded debug interface is presented.Designers can reuse JTAG standard serial port to monitor,trace,and profile the execution of the programs running on an embedded microprocessor.By using pipeline shadow registers and special data path in debug interface circuit,scan chain is no longer needed to insert in the critical path of CPU to facilitate non-intrusive debug capability.To improve data transmission rate of JTAG interface,instruction register and related control logic are redesigned.JTAG proxy debug protocol is also illustrated in JTAG protocol converter implementation to facilitate the porting of debug tools.The solution has been proven by silicon,and debug interface is successfully implemented in CK510 platform.
An SW-HW Co-Design Debug Interface for SOCs Based on JTAG

LIU Yang,WU Wang-hua,ZHOU Xiao-fang,ZHOU Dian

DOI: https://doi.org/10.3969/j.issn.1000-7180.2007.11.010

2007-01-01

Abstract:The paper presents an on-chip debug system for embedded microprocessors. It contains design of both hardware and software. Some optimization strategies are used to improve hardware design, so the SOC owns large test coverage, great stability and good timing. The software part is hierarchical, which communicate with hardware and user interface.
Research and Application of HIL Automatic Test Platform for DCT Control System

Zhixin Chen,Baixue Qu,Ronghui Zhang,Mingyang Sun,Yan Zheng

DOI: https://doi.org/10.3969/j.issn.1000-3703.2017.07.001

2017-01-01

Abstract:The Hardware-In-Loop (HIL) test platform of the Dual Clutch Transmission (DCT) controller was built. In combination of practical program to interpret the automatic test process, and using modular test library to rapidly establish logic test sequence, and by using parameterized design to realize reusing of test sequence, through writing script to realize interaction of Excel and AutomationDesk, which makes the automatic test results more intuitive. In combination of practical example injected with faults, the effect of automatic test was verified, which show that the platform can rapidly and effectively verify DCT control strategy in project development, and improve quality of control software.
Design & Implementation Of An A-Type Residual Current Circuit Breaker Ic

Yan Han,Chen Ding,Xinli Shou

DOI: https://doi.org/10.1109/ISIE.2012.6237098

2012-01-01

Abstract:Nowadays, electrical equipments are becoming more and more complex in industrial production and people's daily lives. The case that non-sinusoidal residual current appearing in the power grid is gradually increasing in modern society. However, the traditional AC-type leakage protector is insensitive to such residual current, and it cannot have an effective protection. So the A-type leakage protector which is more functional is becoming widely used. This paper introduces a new ASIC chip ZDAB01 for A-type leakage protector. This chip is designed and implemented in CSMC 0.5um Mixed CMOS process, and has completely independent intellectual property rights. Test results has confirmed that ZDAB01 performance meets the corresponding provisions of the national standard and has a strong anti-interference ability. The A-type leakage protector becomes more and more popular, and ZDAB01 chip will show great market prospects and social benefits. 1.
An improved method for test chip design

PAN Wei-wei,ZHANG Bo,ZHENG Yong-jun,SHI Zheng,YAN Xiao-lang

2013-01-01

Abstract:The rapid development of IC manufacturing technology poses huge challenges to localize an electrical defect to a specific area on the IC.Either traditional or existing addressable design methods of test chip fail to fulfill the current requirements for fast and accurate defect localization.In this paper,we present an improved method for addressable test chip design.For electrical testing of test chip,four-terminal connection of each test structure and single NMOS transistor as switch are used to improve measurement accuracy,peripheral circuits design simplicity as well as area efficiency.For defect localization,only a small amount of pads are added and used together with switches to localize physical faults.This method is used in a 110nm CMOS technology and verified by the silicon results,which shows several real defects(metal open,etc) are localized to help determine the physical root causes and realize a rapid yield improvement.
Research on DFT of Digital Circuits Based on IEEE 1149.1 and Based on IEEE 1500

Sheng Jian Chen,Yong Yu Chen,Xiao Bing Zhu

DOI: https://doi.org/10.4028/www.scientific.net/amm.568-570.1248

2014-01-01

Applied Mechanics and Materials

Abstract:In the field of digital circuit testability design,IEEE 1149.1 standard focuses on System ON board (SOB) test,while the IEEE 1500 standard is for embedded cores test on chip.Although there is a clear definition of two standards, they have a certain relevance.This article will from the process, test principle, test architecture and related test language to analyzethese two standards, concluding that the differences and similarities .Finally, some problems will be pointed out when use the two standards and then make a prospect on the development of the standards.
Software Toolkit for Developing IEEE1445 Data

Zhang Jiabin,Niu Daoheng,Wang Hong,Yang Shiyuan

DOI: https://doi.org/10.3969/j.issn.1008-0570.2006.34.067

2006-01-01

Abstract:Digital Test Interchange Format (DTIF),accepted as the standard format for PCB level faults diagnosis,has been widely sup- ported by various ATEs. However, the DTIF files are not easy to read and there' s no effective way to interact with the files direct- ly.DTIFAssist,a software toolkit for developing DTIF files is introduced. It implements the visualization of the data files, guides devel- opers the process of TPS development,and finally converts test data into standard format.With its help,historical test data can be reused on ATEs,test cost will then be reduced.
Testing and fault detecting of analog integrated circuit

Zhihua Wang

1995-01-01

Tien Tzu Hsueh Pao/Acta Electronica Sinica

Abstract:The problems related to the testing and fault detecting of analog integrated circuits are reviewed. The specification oriented testing technique is introduced first. Then the fault model of analog integated circuits and the fault oriented testing method are discussed. After the introduction of testability and the design for testability of analog integrated circuits, a new algorithm for the testing and fault detecting of analog integrated circuits based on the monitoring of power supply current is discussed in detail.
The Application of Traveling Probe Test Technology and Analysis of the Test Result

Tao Yao

2003-01-01

Abstract:The software applied in testing traveling Probe of Printed Circuit Board (PCB) as well as how to deal with the troubles in testing are discussed in the paper, the cause of closed and short circuit are analysed to ensure the quality of PCB products.
The Research and Realization of Device Description Technology

Guiping Zhou,Jun Li,Hong Wang

DOI: https://doi.org/10.1109/iccsee.2012.436

2012-01-01

Abstract:Various devices are needed with the continuously improved automation degree. As a result, the configuration becomes more and more time-consuming. The device description and FDT/DTM technology solved the problem. The paper analyzes the advantage and differences of these two technologies. The realization of these two technologies on the NCSPT105IIwith HART protocol proposes a method of multi-technology to meet the complicated and various environments of industrial applications.
An Overview of Design Methodology and Design for Testability for SOC's

陆盘峰,魏少军

DOI: https://doi.org/10.3969/j.issn.1004-3365.2004.03.005

2004-01-01

Abstract:With the development of microelectronics technology and design techniques, system-on-a-chip (SOC) is becoming one of the main solutions to handle the increasing complexity of IC design. Latest development of the design methodology and design for testability for SOC's are reviewed. Problems to be solved in testing SOC's are discussed,and different structures and strategies for SOC test are described. Finally, the development trend of SOC design methodology and design for testability are predicted.
High-Level Testing of Digital VLSI Circuits and Its Developing Trend

CHENG Ben-mao,WANG Hong,XING Jian-hui,YANG Shi-yuan

DOI: https://doi.org/10.3969/j.issn.1004-3365.2006.02.016

IF: 1.992

2006-01-01

Microelectronics Journal

Abstract:High-level testing of digital VLSI circuits is briefly reviewed.The most important high-level test approaches are described.High-level fault models and its mapping with the stuck-at faults are presented.And finally,the developing trend of high-level testing is discussed.
A JTAG-based Configuration Circuit Applied in SerDes Chip.

Xun Jiang,Xiaoxin Cui,Dunshan Yu

DOI: https://doi.org/10.1109/asicon.2011.6157303

2011-01-01

Abstract:In this paper, a design of JTAG-based configuration circuit applied in 2.5 Gbps SerDes (Serializer & Deserializer) mixed digital-analog chip is implemented with SMIC 0.13um technology. The configuration circuit mainly involves two functional components: CR control port and JTAG interface module. The control signals of the whole chip are incorporated in a group of control registers (CRs), which can be accessed through CR control port. The JTAG architecture with 5 standard pins is adopted to load a stream of override data bits into CR port. By applying this combinational configuration methodology, the amount of pinout of the chip has been largely reduced, thus resulting in an efficient saving of chip area. The testing result shows the configuration circuit works perfectly in actual system.
Application of CPLD in the Industrial CT System

齐明睿,李荐民,赵昊彤

DOI: https://doi.org/10.3969/j.issn.0258-0934.2004.05.025

2004-01-01

Abstract:In this paper, the application of CPLD in the industrial CT system is discussed. The paper gives an architecture design and the realization of synchronized trig module in the scan control sub system; and also presents the circuit diagram and some result in detail. In the experimental CT system, it is well proved that the application of in system programmable device supplies many advantages: the complexion of system and circuit is reduced; the process of debug and test is very simple; the system is flexible and the testing time is short.

An Overview of JTAG Technology: Development and Application

A novel on-chip debug system with quick all-registers scan chain based on JTAG

A JTAG Standard-based Test Circuit Design for SOC System

A SOC Test Circuit Design and Implement Based on JTAG

Design and implementation of a PCB testing system

ARM DEBUGGER BASED ON JTAG

The Algorithm and Implementation of a Universal PCB Testing System

A Method of Embedded Debug Interface Based on JTAG Protocol

An SW-HW Co-Design Debug Interface for SOCs Based on JTAG

Research and Application of HIL Automatic Test Platform for DCT Control System

Design & Implementation Of An A-Type Residual Current Circuit Breaker Ic

An improved method for test chip design

Research on DFT of Digital Circuits Based on IEEE 1149.1 and Based on IEEE 1500

Software Toolkit for Developing IEEE1445 Data

Testing and fault detecting of analog integrated circuit

The Application of Traveling Probe Test Technology and Analysis of the Test Result

The Research and Realization of Device Description Technology

An Overview of Design Methodology and Design for Testability for SOC's

High-Level Testing of Digital VLSI Circuits and Its Developing Trend

A JTAG-based Configuration Circuit Applied in SerDes Chip.

Application of CPLD in the Industrial CT System