Testing and fault detecting of analog integrated circuit

Zhihua Wang
1995-01-01
Tien Tzu Hsueh Pao/Acta Electronica Sinica
Abstract:The problems related to the testing and fault detecting of analog integrated circuits are reviewed. The specification oriented testing technique is introduced first. Then the fault model of analog integated circuits and the fault oriented testing method are discussed. After the introduction of testability and the design for testability of analog integrated circuits, a new algorithm for the testing and fault detecting of analog integrated circuits based on the monitoring of power supply current is discussed in detail.
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