Oscillation-Based Test Technique for Analog Circuits

Hu Geng,Wang Hong,Yang Shiyuan
DOI: https://doi.org/10.3969/j.issn.1003-353X.2008.10.001
2008-01-01
Abstract:The development in IC design and fabrication brings great challenges to circuit test.Test of analog circuits is especially a difficulty.Nowadays a lot of researches are done in this domain,dedicating for decreasing test difficulty and reducing test cost.A test technique for analog circuits called "oscillation-based test" is introduced,the present status is summarized including the construction of oscillator,the measurement and interpretation of test response and so on.Meanwhile the advantages and limitations of this technique are concluded,and the prospect of future development is also presented.
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