Practical system for phase noise measurement of optoelectronic oscillators

CHI Jin-gang,JIN Tao,CHI Hao,XU Wei,ZHAO Xin-wei,DENG Yuan
DOI: https://doi.org/10.3969/j.issn.1002-5561.2013.04.014
2013-01-01
Abstract:A practical system and a new system calibration method has been proposed to measurethe phase noise performance for optoelectronic oscillators(OEO).It is advantageous to use the method because of its low cost,fewer devices that required and the capability of measuring various optoelectronic oscillators with different structures.The experimental results and the theoretical analysis has good consistency.
What problem does this paper attempt to address?