Design of test instruments for transistor output characteristics curves

Liu Xiaoyan,Zhang Zunqiao,Jin Ping
DOI: https://doi.org/10.16791/j.cnki.sjg.2011.01.020
2011-01-01
Abstract:The principle of a kind of test instruments for transistor output characteristics curves based on pure analog circuits is introduced.The overall block diagram of the instrument is described,and the design ideas and points of the main unit circuits are elaborated in detail.The experiment results show that the instrument with general oscillograph can be used to observe the clear and stable output characteristic curves of transistors.Compared with the special transistor characteristic exhibit instrument,this instrument is cheaper,and its operation is simpler.Therefore it can replace the transistor characteristic exhibit instrument in the electronic circuit experiment teaching and some project application.
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