Development of the Instrument for Testing Active Device's Voltage-Current Characteristic

Qi Zhang
2001-01-01
Abstract:A new method of testing the voltage-current characteristic of an active device was put forward. By the method, the real shore curcuit current of an active device with little internal resistance can be measured but it may not be damaged because of overheating. The hardware block diagram of the measuring curcuit was presented. The curcuit consists of a narrow pulse fixed voltage electronic load curcuit, a peak current sampling-holding curcuit and a chip microprocessor for measuring and controlling curcuit. An example shows that the avarage measuring error of the curcuit is less than one thousandth.
What problem does this paper attempt to address?