Multi-frequency Test for analog circuits

Cheng Wang,Yun Ye,Hailang Liang,Jin He,Mansun Chan
DOI: https://doi.org/10.1109/EDSSC.2013.6628185
2013-01-01
Abstract:In this paper, multi-frequency test is presented, which can maximize differences between the failure state and the normal state of the analog circuit's response. Using sensitivity analysis, the multi-frequency test vectors of the circuit under test(CUT) are generated and chosen. The experimental results show that this approach is very effective and highly practical for multi-frequency test vectors of the analog circuits.
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