Abstract:In response to the limitations posed by noise interference in complex environments and the narrow focus of existing diagnosis methods for jointless track circuit faults, an innovative approach is put forward in this study. It involves the application of the continuous wavelet transform (CWT) for signal preprocessing, along with the integration of a deep belief network (DBN) and a genetic algorithm (GA) to improve the least-squares support vector machine (LSSVM) model for intelligent time–frequency fault diagnosis. Initially, the raw induced voltage signals are transformed using continuous wavelet transformation resulting in wavelet time–frequency representations that combine temporal and spectral information. Subsequently, these time–frequency representations are fed into the deep belief networks, which perform semi-supervised dimensionality reduction and feature extraction, thereby uncovering distinct fault characteristics in the track circuit. Finally, the genetic algorithms are employed to improve the kernel function and penalty factor parameters of the least-squares support vector machine, thus establishing an optimal DBN-GA-LSSVM diagnostic model. Experimental validation demonstrates the effectiveness of the proposed time–frequency intelligent network model by leveraging the advantages of deep belief networks in hierarchical feature extraction and the superior performance of the least-squares support vector machine in addressing high-dimensional pattern recognition problems with limited samples. The achieved accuracy rate on the testing dataset reaches an impressive 99.6%. Consequently, this comprehensive approach provides a viable solution for data-driven track circuit fault diagnosis.

Fault diagnosis of analog circuits based on multifrequency test and neural networks

Application of multi-frequency test and neural network to fault diagnosis in analog circuits

A novel compound neural network for fault diagnosis

Algorithms Comparation Of Feature Extraction And Multi-Class Classification For Fault Diagnosis Of Analog Circuit

A Neural Network Approach to Fault Diagnosis in Analog Circuits.

Multi-Neural Networks for Faults Diagnosis Based on ICA Feature Extraction

On soft fault diagnosis method based HHT for analog circuits.

Analog fault diagnosis of actual circuits using neural networks

Multi-frequency Test for analog circuits

A novel analog circuit fault diagnosis method based on multi-channel 1D-resnet and wavelet packet transform

Method for Fault Diagnosis of Track Circuits Based on a Time–Frequency Intelligent Network

Fault diagnosis method of analog circuits based on temporal CNN

Strategy for Identifying Analog Circuit Faults Using Improved Neural Network Algorithms

COMPLEX NETWORK APPLICATION IN FAULT DIAGNOSIS OF ANALOG CIRCUITS

A Novel Approach of Feature Extraction for Analog Circuit Fault Diagnosis Based on WPD-LLE-CSA

A Fault Intelligent Diagnosis Approach Based on Element-Oriented Artificial Neural Networks and Fuzzy Integral Fusion

Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform

PFM Neural Network VLSI Circuit for Fault Diagnosis

Test Node Selection for Fault Diagnosis in Analog Circuits using Faster RCNN Model

Study on Soft Fault Diagnosis of Analog Circuits

A novel approach of analog circuit fault diagnosis utilizing RFT noise estimation