A new approach for analog fault diagnosis with tolerance
Li Ye,Houjun Wang,Shulin Tian
DOI: https://doi.org/10.3724/SP.J.1187.2009.07006
2009-01-01
JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT
Abstract:This paper addresses itself to analog circuit diagnosis by means of fault dictionary and fuzzy technique.To overcome the two major limitations of the classical fault dictionaries,a fuzzy rules dictionary and a node voltage increment ratio vectors dictionary,both deduced by the node voltage sensitivities,are constructed.The new dictionaries,like the classical ones,can detect and locate single catastrophic faults and,in contrary to the classical ones,they detect and locate parametric faults as well.Moreover,the new approach allows identification of these faults,such that sign of the faulty parameter deviation is designated.The proposed system has some advantages such as the detect-ability of wide faults coverage,minimal storage space and computational complexity,less simulation runs.The experiment results prove the effectiveness of the new approach in analog fault diagnosis with tolerance.