Selection Method of Wavelet Bases on Feature Extraction for Analog Circuit Fault Data

Wang Yuehai,Cheng Ran,Jiang Aimin,Wang Tongwei
DOI: https://doi.org/10.16526/j.cnki.11-4762/tp.2011.06.029
2011-01-01
Abstract:Wavelet has been widely used in compressing dimension and extracting effective and sensitive feature in high-amount sample data of analog circuit fault diagnosis.However,there is no standard to select wavelet bases.A selection method combined wavelet decomposition,eigenvector computation and volatility function was proposed and the effectiveness was verified by a diagnosis example in analog circuit fault diagnosis system which integrated wavelet,BP neural networks.Taken 9 commonly used wavelet function to decompose of the sampled signal and calculate the volatility.The volatility of wavelet functions bior2.2 is min and it's consistent with the diagnosis.
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