Abstract:As an essential part in electronics-rich system, the failure of analog circuits will severely affect the system reliability and security. Incipient fault of analog circuit refers to the early stage of degradation fault where the fault characteristics are generally weak and almost indistinguishable. In order to enhance the reliability of electronic systems, it is necessary to diagnose incipient faults of analog circuits promptly and effectively. Existing approaches generally capture fault characteristics only from single signal, ignoring the valuable information inherent in different domains and scales. To address this problem, a novel diagnostic strategy based on multi-scale feature extraction and multi-channel feature fusion is designed to guarantee the completeness and richness of fault information. In this study, a deep extreme learning machine denoising auto-encoder (DELM-DAE) based method is proposed to conduct unsupervised multi-scale and multi-channel feature fusion to extract distinguishable features for incipient faults. The proposed method has higher learning efficiency and overcomes the common problem of low efficiency in deep learning model training. Meanwhile, in order to improve the ability to distinguish high-resolution features, an ensemble hybrid kernel extreme learning machine with novel roulette selection and weighted voting scheme is proposed to enhance the recognition performance and stability. In the verification experiment, the diagnosis accuracy on four typical circuits all reaches above 98%, which demonstrates that the proposed incipient fault diagnosis method for analog circuits has more conspicuous performance than other state-of-the-art methods.

An Analog Circuit Fault Diagnosis Approach Based on Improved Wavelet Transform and MKELM

A Novel Approach of Feature Extraction for Analog Circuit Fault Diagnosis Based on WPD-LLE-CSA

Selection Method of Wavelet Bases on Feature Extraction for Analog Circuit Fault Data

Algorithms Comparation Of Feature Extraction And Multi-Class Classification For Fault Diagnosis Of Analog Circuit

Wavelet-Based Feature Extraction in Fault Diagnosis for Biquad High-Pass Filter Circuit

Analog Circuit Fault Diagnosis Using Wavelet Feature Optimization Approach

A Novel Approach for Diagnosis of Analog Circuit Fault by Using GMKL-SVM and PSO

A Novel Incipient Fault Diagnosis Method for Analog Circuits Based on GMKL-SVM and Wavelet Fusion Features

A fault diagnosis method for analog circuits based on EEMD-PSO-SVM

A Fault Diagnosis Method for Analog Circuits Based on Improved TQWT and Inception Model

A New Approach for Analog Circuit Fault Diagnosis Based on Extreme Learning Machine

Analog circuit fault diagnosis method using adaptive wavelet analysis and SVM

Analog circuit fault identification approach based on wavelet analysis and hierarchical decision

An Intelligent Fault Diagnosis Approach of Analog Circuit Based on KLDA and OAOSVM

A Fault Diagnosis Approach for Analog Circuits with Support Vector Machines

A Novel Approach To Diagnosis Of Analog Circuit Incipient Faults Based On KECA And OAO LSSVM

Analog Circuit Incipient Fault Diagnosis from Raw Signals Using Multi-Layer Extreme Learning Machine

Incipient Fault Diagnosis of Analog Circuit with Ensemble HKELM Based on Fused Multi-Channel and Multi-Scale Features

Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE

Nonlinear Analog Circuit Fault Diagnosis Using Wavelet Leaders Multifractal Analysis Method

Wavelet neural networks based fault diagnosis of analog circuit