Dynamic Current Testing on Power Supply Noise

陆思安,严晓浪,沈海斌,何乐年
DOI: https://doi.org/10.3969/j.issn.1007-0249.2003.02.027
2003-01-01
Abstract:Power supply noise is more and more prominent during DSM (Deep Sub-Micrometer) circuit design, and testing of the faults caused by power supply noise is getting more important. For this reason, a dynamic current testing approach is proposed to test the faults caused by power supply noise. Different from IddQ testing, dynamic current testing judges the existence of fault in the circuit by power current changing during circuit switching. According to the analysis on simulation results, dynamic current testing is effective.
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