Design of reusable MCU core testbench

Xu Sheng,Gao Minglun,Li Wei,Lou Xiaoxiang

DOI: https://doi.org/10.3969/j.issn.1002-7300.2008.01.030

2008-01-01

Abstract:With the augment of IP core size,the test complexity becomes greater day by day.This paper introduces reusable testbench design aiming at the MCU core.The 8051 IP core tests using this method are completed quite well.

What problem does this paper attempt to address?

A Test Architecture for Test Reuse in SOC Design

王超,沈海斌,陆思安,严晓浪

DOI: https://doi.org/10.3969/j.issn.1004-3365.2004.03.025

2004-01-01

Abstract:A chip test architecture implementing IP core test reuse in SOC design generally includes two parts: 1) a test access mechanism (TAM), which transmits test stimulus and response, and 2) a chip test controller, which realizes test control. A chip test architecture based on test bus is analyzed in the paper, and test scheduling in SOC is explained. Finally, the design of the chip test controller is presented, which is capable of carrying out test scheduling.
Test wrapper design for IP-core test reuse

陆思安,严晓浪,李浩亮,沈海斌,何乐年

DOI: https://doi.org/10.3785/j.issn.1008-973X.2004.01.019

2004-01-01

Abstract:An improved wrapper cell was presented based on analysis of two kinds of wrapper cells. It adds a mux to the traditional P1500 wrapper cell, which can test the data path of wrapper cells, resolve the problem of safe shifting of scan chains during shifting and reduces the dynamic test power during scan shifting. A kind of wrapper, namely a tri-state wrapper, was put forward based on analysis of two kinds of wrappers; IEEE P1500 wrapper and Philip TestShell. The architecture allows different cores to be connected directly to the same test bus.
Challenges for Progress in Test and Design for Testability

张永光,徐元欣,王匡

DOI: https://doi.org/10.3969/j.issn.1003-353x.2005.02.011

2005-01-01

Abstract:CMOS device dimensions scale down to the very deep submicrometer. ICs are going towards higher density, higher speed and lower power dissipation, making new challenges on IC test and design for test. The idea of test and design for testability is discussed, the challenges of test and design for testability are analyzed, then the test and design for testability in SOC design are discussed. The progresses in test and design for testability are put forward.
Functional Verification of EPA Chip

Qiu Li,Feng Dong-qin

DOI: https://doi.org/10.1109/iceice.2011.5777483

2011-01-01

Abstract:This paper presents a new verification method exercised on EPA chip. This method is to build a coverage-driven functional verification testbench, with constraint random stimulus and direct stimulus. The hierarchical testbench, which is developed based on Open Verification Methodology (OVM), is reusable and efficient. Compared to traditional verification methods, it's proved that this new one has greatly saved verification time and manpower, enhanced verification unit reuse.
Design of IP core test wrapper based on IEEE 1500 standard

Qiao Liyan,Xiang Gang,Yu Yang,Wang Shuai

DOI: https://doi.org/10.3969/j.issn.1002-7300.2010.07.024

2010-01-01

Abstract:With the continuous improvements on the scale of integrated circuits,the technology of IP core-based SOC design is widely used.Because of the fact that IP cores usually come from different providers and the incompatibility of design standard,it becomes more and more difficult to test SOC.IEEE 1500 standard's goal is standardizing the test interface between IP core providers and core users and aims at improving ease of test reuse and test integration with respect to the core-based SOC.The background of the IEEE 1500 standard,the basic structure and the test instructions set are described in this paper firstly.Then taking s349 sequential circuit for example,we describe the design of test wrapper based on the IEEE 1500 standard for embedded IP core in detail.Finally we verify the test wrapper's efficiency under different test instructions through simulating experiments.
Microcontroller Based Testing of Digital IP-Core

Amandeep Singh,Balwinder Singh

DOI: https://doi.org/10.48550/arXiv.1205.1866

2012-05-09

Hardware Architecture

Abstract:Testing core based System on Chip is a challenge for the test engineers. To test the complete SOC at one time with maximum fault coverage, test engineers prefer to test each IP-core separately. At speed testing using external testers is more expensive because of gigahertz processor. The purpose of this paper is to develop cost efficient and flexible test methodology for testing digital IP-cores . The prominent feature of the approach is to use microcontroller to test IP-core. The novel feature is that there is no need of test pattern generator and output response analyzer as microcontroller performs the function of both. This approach has various advantages such as at speed testing, low cost, less area overhead and greater flexibility since most of the testing process is based on software.
An improved method for test chip design

PAN Wei-wei,ZHANG Bo,ZHENG Yong-jun,SHI Zheng,YAN Xiao-lang

2013-01-01

Abstract:The rapid development of IC manufacturing technology poses huge challenges to localize an electrical defect to a specific area on the IC.Either traditional or existing addressable design methods of test chip fail to fulfill the current requirements for fast and accurate defect localization.In this paper,we present an improved method for addressable test chip design.For electrical testing of test chip,four-terminal connection of each test structure and single NMOS transistor as switch are used to improve measurement accuracy,peripheral circuits design simplicity as well as area efficiency.For defect localization,only a small amount of pads are added and used together with switches to localize physical faults.This method is used in a 110nm CMOS technology and verified by the silicon results,which shows several real defects(metal open,etc) are localized to help determine the physical root causes and realize a rapid yield improvement.
Design for Testability for System-on-Chip

王永生,肖立伊,毛志刚,叶以正

DOI: https://doi.org/10.3321/j.issn:0253-374x.2002.10.025

2002-01-01

Abstract:The system-on-chip(SoC)based on reusable embedded IP(intellectual property)poses new challenges for test,and the new test methodology and strategy for SoC are needed.Several main current design-for-testability (DFT)techniques for SoC are described along with their features,advantages and disadvantages.The IEEE P1500 and VSIA(virtual socket interface alliance)test access architecture schemes for SoC in the international industry are discussed.
Secure Test Wrapper Design for Embedded IP Cores

YU Yang,XIANG Gang,QIAO Li-yan

2011-01-01

Abstract:The IEEE 1500 standard was proposed to standardize the IP(Intellectual Property) core test interface to transfer test information.But the typical IEEE 1500-compliant test wrapper would lead IP cores into an insecure status during scan shifting.This paper presented a secure test wrapper design for embedded IP cores,which only inserted a CMOS(Complementary Metal Oxide Semiconductor) transmission gate to the test wrapper cell to eliminate the precarious effect to IP cores.Experiments show that the proposed test wrapper not only takes less area overhead and time delay,but also can test the data path and reduce the data transitions at the input port of IP cores,thus decreases the dynamic test power during scan shifting.
A Verification Methodology for Reusable Test Cases and Coverage Based on System Verilog

Lingling Chai,Zheng Xie,Xin'an Wang

DOI: https://doi.org/10.1109/edssc.2014.7061166

2014-01-01

Abstract:As the size and complexity of SoC design grow, it is common to establish a scalable and reusable verification test bench for verification engineers. To improve the efficiency of verification and reduce the development time and effort in chip design projects, the extensive and reusable test case model and function coverage model for the special circuit and the standard protocols should be focused on by verification engineers. In this paper, a verification methodology for reusable test cases and coverage is described. As an example, a reusable test bench of chain table DUT is utilized to verify the feasibility of the verification methodology.
Optimal Test Access Chain Configuration for Reusing NoC to Test IP Cores

赵建武,师奕兵,王志刚

IF: 1.992

2009-01-01

Microelectronics Journal

Abstract:Restrictions between different test modes of various hierarchical IP cores were discussed.A wrapper architecture was presented.A heuristic test for IP core was proposed to get optimal test access chain configuration and minimize the number of test packets and overall test time required for embedded core test.Finally,experimental test for SoC p22810 of ITC'02 SoC Test Benchmark were realized by using NoC test platform.
SOC Testing Based on Reuse

王红,邢建辉,杨士元

DOI: https://doi.org/10.3969/j.issn.1003-353x.2004.05.015

2004-01-01

Abstract:SOC is increasingly designed by embedding reusable cores. A reuse-based teststrategy for such ICs is often attractive and sometimes even mandatory. Main kinds of SOC teststrategies are analyzed and surveyed from the reuse point. Finally, we discuss the issues remain tobe resolved.
Challenges In Testing Embedded-Core-Based System On Chips

Jh Feng,Yh Sun

2001-01-01

Abstract:A major challenge in realizing core-based system-on-chips is the adoption of adequate test strategies. This paper analyzes the current solutions to create testable core-based system-on-chips. It discusses the challenges in testing embedded cores, the testing requirements for individual cores, and their test access mechanisms. It also covers the integrated test strategies for system-on-chips based on reusable cores.
Function Verification of Interface IP Core Based on the Restricted Random Test Bench

MENG Qing-dong,CHEN Jia-jia,LI Zhao-lin

DOI: https://doi.org/10.3969/j.issn.1002-2279.2010.05.006

2010-01-01

Microprocessors

Abstract:During the design of SOC system,random test is becoming an application for IP cores verification.To test the integrated EMIF IP core used direct verification and restricted random verification methods,added flexible generation of parameterized script files and adaptable random test points.Based on the verification environment built,some tasks were created and passed as transactions according to the analysis of simulation interface and output results.Standard memory modules were integrated with timing factors to support verification.It has been proved that the method is much more flexible and practicable as result,which illustrates to improve the whole efficiency of verification.
System-on-Chip: Reuse and Integration

R. Saleh,S. Wilton,S. Mirabbasi,A. Hu,M. Greenstreet,G. Lemieux,P.P. Pande,C. Grecu,A. Ivanov

DOI: https://doi.org/10.1109/jproc.2006.873611

IF: 20.6

2006-06-01

Proceedings of the IEEE

Abstract:Over the past ten years, as integrated circuits became increasingly more complex and expensive, the industry began to embrace new design and reuse methodologies that are collectively referred to as system-on-chip (SoC) design. In this paper, we focus on the reuse and integration issues encountered in this paradigm shift. The reusable components, called intellectual property (IP) blocks or cores, are typically synthesizable register-transfer level (RTL) designs (often called soft cores) or layout level designs (often called hard cores). The concept of reuse can be carried out at the block, platform, or chip levels, and involves making the IP sufficiently general, configurable, or programmable, for use in a wide range of applications. The IP integration issues include connecting the computational units to the communication medium, which is moving from ad hoc bus-based approaches toward structured network-on-chip (NoC) architectures. Design-for-test methodologies are also described, along with verification issues that must be addressed when integrating reusable components.

engineering, electrical & electronic
A Method of Online Debugging for the Application Codes of 8051 IP Core on FPGA

TANG Xu,WANG Jia,PU Xiao-rong

DOI: https://doi.org/10.3969/j.issn.1006-7167.2014.03.029

2014-01-01

Abstract:To improve the open and synthetic experiment in the national experiment teaching demonstrating center of my school,the author propose a method of real time simulation about the application programming in the MC8051,and open source 8051 compatible IP core implemented on FPGA. To implement this method,the storage structure of Harvard in original MC8051 core is modified to a storage structure of Von Neumann. The manipulation of this method is through the Keil Debugger with Monitor-51 driver. The mainly step of this method and an experiment on the Xilinx FPGA platform is discussed. It shows that the proposed method can accelerate the development of the 8051 IP based aplication,and benefit the integration of the experiment teaching about the EDA and the microcontroller.
Testbench Generation For Reconfigurable Media Processor

ChenYang Wang,Shouyi Yin,Shaojun Wei

DOI: https://doi.org/10.1109/ICCCAS.2008.4658025

2008-01-01

Abstract:Testbench generation is of great importance for function verification of RCA. Traditional testbench generation using pseudo-random method is not very effective; so many other generations have been developed. In this paper, genetic algorithm based generation with syntax restriction is introduced at length. The method with syntax restriction not only generates more executable testbenches for reconfigurable media processor but also has high coverage and efficiency than pseudo-random generation method. Two programs using this method and pseudo-random generation are designed respectively, and experiment results comparison are represented at the end of the paper, which shows that genetic algorithm with syntax restriction will benefit testbench generation.
A Cost-Effective Pre-Bond Functional Test Architecture for 3d Socs

Xiangwei Huang,Pu Pang,Xiaoyao Liang,Li Jiang

DOI: https://doi.org/10.1109/icam.2016.7813601

2016-01-01

Abstract:We proposed a novel pre-bond functional test architecture for core -level partitioned 3D SoCs. In this test architecture, a new test access mechanism is built by probing functional Through Silicon Vias (TSVs) and by linking functional TSVs to all pins of IP cores under test. In order to reduce the Design-for-Test (DfT) cost, we propose a novel scheme to share the functional TSVs among pins of IP cores and reuse wires which connect pins to the same functional TSVs. Experimental results based on the MCNC benchmarks circuits demonstrate the feasibility and effectiveness of the DfT optimization methods.
Software- Based Self-Testing Methodology for Embedded Processor Cores

DING-Tao,Hong-he TAN,Yi-he SUN

DOI: https://doi.org/10.3969/j.issn.1002-2279.2011.04.004

2011-01-01

Microprocessors

Abstract:In contrast with stronger ASIC function and cheaper production cost,test cost is on the increase.Traditional test technique doesn't meet the test request of high speed and multi clock SOC.It is inevitable to develop new test technique and reduce test cost.This paper presents a Soft-Based Self-Testing(SBST) method,it uses the embedded processor core of the Device-Under-Test(DUT),completes the self diagnose of chip by executing test program.This method can apply at-speed test while alleviating the need for high-speed testers.It can be applied in test process for low resolution fault location.Finally,the SBST method demonstrates successful application to an audio SOC.
Design of an 8051 core with pipeline structure based on AISC

Shi Dalong,Tang Jian,Zhou Yuanyuan,Huang Lu

DOI: https://doi.org/10.3969/j.issn.1674-7720.2013.08.007

2013-01-01

Abstract:Based on the analysis of original 8051 and under the condition of keeping instruction set unchangeable, a MCU based on ASIC is designed. This design applies three stage pipeline to improve the effect of execution. This design of 8051 core can work well according to the simulation and test.

Design of reusable MCU core testbench

A Test Architecture for Test Reuse in SOC Design

Test wrapper design for IP-core test reuse

Challenges for Progress in Test and Design for Testability

Functional Verification of EPA Chip

Design of IP core test wrapper based on IEEE 1500 standard

Microcontroller Based Testing of Digital IP-Core

An improved method for test chip design

Design for Testability for System-on-Chip

Secure Test Wrapper Design for Embedded IP Cores

A Verification Methodology for Reusable Test Cases and Coverage Based on System Verilog

Optimal Test Access Chain Configuration for Reusing NoC to Test IP Cores

SOC Testing Based on Reuse

Challenges In Testing Embedded-Core-Based System On Chips

Function Verification of Interface IP Core Based on the Restricted Random Test Bench

System-on-Chip: Reuse and Integration

A Method of Online Debugging for the Application Codes of 8051 IP Core on FPGA

Testbench Generation For Reconfigurable Media Processor

A Cost-Effective Pre-Bond Functional Test Architecture for 3d Socs

Software- Based Self-Testing Methodology for Embedded Processor Cores

Design of an 8051 core with pipeline structure based on AISC