Optimal Test Access Chain Configuration for Reusing NoC to Test IP Cores

赵建武,师奕兵,王志刚
IF: 1.992
2009-01-01
Microelectronics Journal
Abstract:Restrictions between different test modes of various hierarchical IP cores were discussed.A wrapper architecture was presented.A heuristic test for IP core was proposed to get optimal test access chain configuration and minimize the number of test packets and overall test time required for embedded core test.Finally,experimental test for SoC p22810 of ITC'02 SoC Test Benchmark were realized by using NoC test platform.
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