Concurrent Testing for Heterogeneous-Cores in Network-on-Chips

Yi-ming OUYANG,Chao HE,Hua-guo LIANG,Zheng-feng HUANG,Tao XIE
DOI: https://doi.org/10.3969/j.issn.0372-2112.2013.12.011
2013-01-01
Tien Tzu Hsueh Pao/Acta Electronica Sinica
Abstract:The test application time becomes too long due to the heterogeneous-core interconnection in Network-on-Chips . The concurrent test technology is the optimal scheme to solve the problem .A novel test project for NoC is proposed in this article , and efficient concurrent test can be achieved in core-based NoC .Firstly ,the folding partition method is used to change the network partition ,and then it can improve the parallelism of test transmission .Secondly ,the test sets are merged through the sequential shift matching algorithm to make them simple and isomorphic .Finally ,the test sets are injected into the NoC by multicasting .The experi-mental results show that the test application time is reduced by 17.6% -40.47% compared with those in the reference [13 ] and [14 ] ,and our method is implemented easily .
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