A New Concurrent Mechanism for Distributed Hardware-in-the-loop Simulation Test System

Mao Ye,Wei Dong,Yindong Ji,Shuai Wang
DOI: https://doi.org/10.1145/1878537.1878704
2010-01-01
Abstract:By simulating the operation environment, many device characteristics can be tested in Hardware-In-The-Loop (HIL) simulation systems and time cost determines the value of such project. Conventional task decomposition, scheduling and resource sharing mechanisms could no longer fully exploit the concurrency in complex HIL simulation systems since complex and stateful devices are integrated. A novel concurrent mechanism is proposed in this paper to solve this problem. In this mechanism, by decomposing the testing resources of complex devices in the simulation environment hierarchically, modeling and managing the resource working and occupation status, (1) test operations can work at finer granularities; (2) independent tasks can hold sharing resource access locks and execute on same devices simultaneously; (3) the logic correctness of real devices and simulation system can be maintained. By using this new mechanism, the effect of prevailing task scheduling algorithm can be extended. A Simple simulation experiment demonstrates the new mechanism improves the time cost about 20% under same test conditions.
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