Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

Test Access Mechanism Design and Test Controlling for Network-on-Chip.

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Dual-Speed TAM Optimization of 3D SoCs for Mid-bond and Post-bond Testing

Interconnect intellectual property for network-on-chip (NoC)

Concurrent Testing for Heterogeneous-Cores in Network-on-Chips

SOC test architecture design for efficient utilization of test bandwidth

Thermal-Aware Test Scheduling For Noc-Based 3d Integrated Circuits

Test Wrapper and Test Access Mechanism Co-optimization for SoC Based on Ant Colony Algorithm

A Unified Test and Fault-Tolerant Multicast Solution for Network-on-chip Designs

Design and Implementation of Multi-processor Network Access Controller for Network-on-Chip

Design And Implementation Of Cpu & Fpga Co-Design Tester For Sdn Switches

Multicast-Based Testing and Thermal-Aware Test Scheduling for 3d Ics with A Stacked Network-On-Chip

System Level Interconnect Design for Network-on-chip Using Interconnect IPs.

Test Methodology of NoC with Irregular Topology

Testability Analysis for Transparency Paths Ready IP Cores in SoC

New Dft Architectures for 3D-Sics with A Wireless Test Port

Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture

Cost-Effective Power-Aware Core Testing in NoCs Based on a New Unicast-Based Multicast Scheme