Test Methodology of NoC with Irregular Topology

Bai Yuan,Zheng Yan,Wang Hong,Yang Shiyuan
2010-01-01
Journal of Computer Research and Development
Abstract:With the increasing integration and complexity of IC,Network on Chip(NoC),as a new architecture,has been proposed.The researches at present are mainly about NoC with general,regular topology(such as 2D-Mesh).However,NoC with specific,irregular topology are usually used in actual applications.This paper focuses on NoC with irregular topology,researches the test of NoC based on its working ways,and presents a phase-dividing test method which tests NoC in two phases of router reachable test and forwarding functional test.Theoretical analysis and simulation results prove its high fault coverage and efficiency.
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