Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

Test Wrapper and Test Access Mechanism Co-optimization for SoC Based on Ant Colony Algorithm

Test wrapper design for IP-core test reuse

A Test Architecture for Test Reuse in SOC Design

A Hybrid Bionic Optimization Algorithm for Test Access Mechanism of System-on-chip

An SOPC test strategy based on wrapper/TAM co-optimization

Niche Genetic Algorithm Based Optimization of Test Access Mechanism for System-on-chip

An Improved Test Access Mechanism Structure and Optimization Technique in System-on-chip

Hierarchical SoC Testing Scheduling Based on the Ant Colony Algorithm

Using ant colony optimization for test vector reordering

Test scheduling of System-on-Chip using Dragonfly and Ant Lion optimization algorithms

SOC test architecture design for efficient utilization of test bandwidth

Dual-Speed TAM Optimization of 3D SoCs for Mid-bond and Post-bond Testing

A Modified Parallel Wrapper Cell for Hierarchical SOCs Test

Optimizing pre-bond and post-bond test time for three dimension IP cores

An Improved Ant Colony Optimization Algorithm and Its Application to Electromagnetic Devices Designs

Re-Optimization Algorithm for SoC Wrapper-Chain Balance Using Mean-Value Approximation

Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores

Bottleneck Station Scheduling in Semiconductor Assembly and Test Manufacturing Using Ant Colony Optimization.

A Test Architecture for System-On-A-Chip

A Test Pattern Reorder Method Based On Ant Colony Optimization

A Test Set Optimization Method Based on Ant Algorithm