Abstract:In this work, based on the concept of test pattern broadcasting [1], [2], we propose a new core-based testing method which gives core users the maximum level of test freedom. Instead of only using the test patterns delivered by core providers, core users are allowed to broadcast their own test patterns to the cores of a SoC (system on chip) design for parallel scan testing. The fault coverage of each core test, using test patterns developed by any core user, can be evaluated by an enhanced version of a traditional fault simulator. The netlist of each core is scrambled before it is delivered to core users, thus the netlist will not be revealed. The enhanced fault simulator of a core has the capabilities of decoding the scrambled netlist, and performing fault simulation for the test patterns provided by each of the core users. For each core, both random test patterns (applied by a core user), and golden test patterns (delivered by the core provider) jointly achieve high and flexible fault coverage requirements. The enhanced logic simulator of each core can also decrypt the scrambled netlist, and perform logic simulation with the objective of generating fault-free test responses for signature analysis (for example). The proposed method has the advantages of minimizing the number of scan pins, reducing the test application time, and achieving the maximum level of test quality control by core users. Simulation results demonstrate the feasibility of this method.

Challenges In Testing Embedded-Core-Based System On Chips

A Test Architecture for Test Reuse in SOC Design

Microcontroller Based Testing of Digital IP-Core

Challenges for Progress in Test and Design for Testability

Software- Based Self-Testing Methodology for Embedded Processor Cores

An improved method for test chip design

Embedded core test generation using broadcast test architecture and netlist scrambling

SOC Testing Methodology and Practice

The Construction of a Research Environment for SoC Test Integration

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

SOC Testing Based on Reuse

CHIPKIT: An agile, reusable open-source framework for rapid test chip development

Design of reusable MCU core testbench

Evaluating Vulnerability of Chiplet-Based Systems to Contactless Probing Techniques

Testability Analysis for Transparency Paths Ready IP Cores in SoC

A novel layout automation flow to facilitate test chip design for standard cell characterization

A Microprocessor Based SOC Built-In Test Scheme

Bist Approach for Testing Embedded Memory Blocks in System-On-Chips

Design Challenges of Intrachiplet and Interchiplet Interconnection

On Measuring the Transparentability of Cores in Core-Based ICs

Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions