Abstract:Electrostatic discharge (ESD) has been one of the major causes for the failure of electronic equipment and components and have attracted quite significant research efforts in minimizing the losses induced. Much tougher challenge comes up in the nano CMOS era. For the device technology itself, the aggressive scaling on gate length, high-k replacement of gate oxide, and the reduction of supply voltage have made the design window of ESD protection device be ever narrower. New ESD protection devices are yet to be developed for the 10 nm technology and beyond. For system and application level, the mobile devices we used right now are much vulnerable as they are more frequent to be exposed to various sources of ESD and power surges. Fatal ESD strike protection is always the primary design specification and should have been mostly fulfilled. The effects of non-fatal ESD strike has not attracted much attention yet. Recent experiment showed that the non-fatal ESD strikes at gate and drain can cause significant charge trapping and trap generation. It resulted in the device characteristic degradation and hence some reliability issues of CMOS circuits and the MOS-based ESD clamps. This review addresses all these issues in detail.

Electrostatic Discharge Protection Framework for Mixed-Signal High Voltage CMOS Applications

ESD Circuits Design for High-Speed Analog CMOS Integrated Circuits

Electro-Thermo-Mechanical Investigation On Multi-Level Interconnects In The Presence Of An Esd Pulse

Research Of Designing For The High Voltage Device In Cmos Hv-Ic

Silicon-Controlled Rectifier Stacking Structure for High-Voltage ESD Protection Applications

Analysis of 65 Nm Technology Grounded-Gate NMOS for On-Chip ESD Protection Applications

On the ESD Protection and Non-Fatal ESD Strike on Nano CMOS Devices

Evaluation of RF electrostatic discharge (ESD) protection in 0.18-μm CMOS technology

Novel Electrostatic Discharge Protection Design Method

Power System ESD Protection Circuit Design in CMOS IC

Design and Analysis of Full-Chip HV ESD Protection in BCD30V for Mixed-Signal ICs.

A Systematic Study of ESD Protection Co-Design with High-Speed and High-Frequency ICs in 28 Nm CMOS.

Investigation on Bi-directional SCR ESD Protection Devices in a 0.18 μm RF CMOS Process

An Investigation on Capacitance-Trigger ESD Protection Devices for High Voltage Integrated Circuits

On Chip Electrostatic Discharge Protection for MEMS Gas Sensor System

A capacitance coupling complementation SCR for on-chip electrostatic discharge protection

A Novel On-Chip Electrostatic Discharge Protection Design for Rf Ics

Electrothermal Characterization of Multilevel Cu-Graphene Heterogeneous Interconnects in the Presence of an Electrostatic Discharge (ESD)

Ggnmos As Esd Protection in Different Nanometer Cmos Process

Power Bus ESD Protection Structure Design in CMOS IC

A Study of Process/device/layout Co-Design for Full-Chip ESD Protection in BCD Technology