Abstract:Electrostatic discharge (ESD) has been one of the major causes for the failure of electronic equipment and components and have attracted quite significant research efforts in minimizing the losses induced. Much tougher challenge comes up in the nano CMOS era. For the device technology itself, the aggressive scaling on gate length, high-k replacement of gate oxide, and the reduction of supply voltage have made the design window of ESD protection device be ever narrower. New ESD protection devices are yet to be developed for the 10 nm technology and beyond. For system and application level, the mobile devices we used right now are much vulnerable as they are more frequent to be exposed to various sources of ESD and power surges. Fatal ESD strike protection is always the primary design specification and should have been mostly fulfilled. The effects of non-fatal ESD strike has not attracted much attention yet. Recent experiment showed that the non-fatal ESD strikes at gate and drain can cause significant charge trapping and trap generation. It resulted in the device characteristic degradation and hence some reliability issues of CMOS circuits and the MOS-based ESD clamps. This review addresses all these issues in detail.

Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification

ESDInspector: a New Layout-Level ESD Protection Circuitry Design Verification Tool Using a Smart-Parametric Checking Mechanism

A Technology-Independent CAD Tool for ESD Protection Device Extraction: ESDExtractor

A Study of Accurate Extraction of ESD Parasitic Capacitance

A 3d Mixed-Mode Esd Protection Circuit Simulation-Design Methodology

Novel Electrostatic Discharge Protection Design Method

FOD Based ESD Protection Devices in Deep Sub-micron Technology

Electro-Thermo-Mechanical Investigation On Multi-Level Interconnects In The Presence Of An Esd Pulse

Circuit-level ESD Protection Simulation Using Behavior Models in 28nm CMOS

Transient Electrothermal Analysis of Multilevel Interconnects in the Presence of ESD Pulses Using the Nonlinear Time-Domain Finite-Element Method

A Novel and Powerful TCAD Methodology to Evaluate Performance of ESD Protection Devices

ESD Protection Issues in IC Design

On the ESD Protection and Non-Fatal ESD Strike on Nano CMOS Devices

A Study of Process/device/layout Co-Design for Full-Chip ESD Protection in BCD Technology

System Efficient ESD Design of IO ESD Protection

A Systematic Study of ESD Protection Co-Design with High-Speed and High-Frequency ICs in 28 Nm CMOS.

A Wafer-Level Characterization Method of Esd Protection Circuits for Both Component-Level and System-Level Applications

On-Chip ESD Protection Design for Ics

On Chip Electrostatic Discharge Protection for MEMS Gas Sensor System

Novel ESD Protection Design Methodology and Latchup Prevention for a 0.5-&Amp;#956;m CMOS ASIC Library

Evaluation of RF electrostatic discharge (ESD) protection in 0.18-μm CMOS technology