A Smart Method Of Optimizing The Read/Write Current On Pcm Array

Yiyun Zhang,Houpeng Chen,Zhitang Song,Xi Li,Rong Jin,Qian Wang,Yuchan Wang,Daolin Cai,Yueqing Wang
DOI: https://doi.org/10.1587/elex.11.20140529
2014-01-01
IEICE Electronics Express
Abstract:A method for optimizing the read/write current on phase change memory array is proposed. A smart current adjustment circuit is designed to bi-directionally alter the internal read/write current. The best read/write condition based on arrays can be found through this adjustment approach. Example of a 2-dimensional shmoo test on a 16 k-bit phase change array implemented in 0.13 mu m CMOS technology is given. The resistance distribution can also be roughly obtained. This method, taking advantage of the peripheral circuit, provides statistical yield data on a variety of read/write current, thus offering reliable and helpful indicators for chip parameter setup and process optimization.
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