Control of N/N-2 Species Ratio in No Plasma for P-Type Doping of Zno

Xingyou Chen,Zhenzhong Zhang,Bin Yao,Mingming Jiang,Shuangpeng Wang,Binghui Li,Chongxin Shan,Lei Liu,Dongxu Zhao,Haifeng Zhao,Dezhen Shen
DOI: https://doi.org/10.1063/1.3626069
IF: 2.877
2011-01-01
Journal of Applied Physics
Abstract:Nitrogen-doped ZnO thin films were grown on c-plane sapphire (Al2O3) substrates via plasma-assisted molecular beam epitaxy using plasma activated nitric oxide (NO) as the oxygen source and dopant. X-ray diffraction measurements indicate that a small NO flux benefits the crystal quality of the thin films. Hall effect measurements indicate that the electron density of the ZnO films decreases gradually with decreasing NO flux, and the conduction reverses to p-type at a certain flux. Optical emission spectra indicate that the N atom content in the NO plasma increases with decreasing NO flux, and the origin of this is discussed. X-ray photoelectron spectroscopy measurements demonstrate that the number of N atom occupied O sites in the ZnO lattice increases correspondingly.
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