Growth and Defect Characterization of 6H-SiC Single Crystal Seeded (1015) Plane

高玉强,彭燕,李娟,陈秀芳,胡小波,徐现刚,蒋民华
DOI: https://doi.org/10.16553/j.cnki.issn1000-985x.2010.02.018
2010-01-01
Abstract:The radial expansion growth of 6H-SiC seeded (1015) plane has been achieved by sublimation method. The largest diameter of single crystal reached to 33 mm. Optical micrographs of the longitudinal-cut slices show that micropipes along the growth direction which originate from inclusions chang their direction and then extend on the (0001) plane. It was also observed that the micropipes propagating along the c-axis in seed ended in the interface of seed/crystal. The as-grown surface morphology of crystal was also observed by microscopy. It was found that for a (101n) plane, the density of stacking faults decreased with the increase of n value. This result is confirmed by the etching morphology of the cross section slices. A high-quality single crystal area is gained due to the termination of micropipes and the decrease of density of stacking fault.
What problem does this paper attempt to address?