Abstract:A lead-free piezoelectric material with ultra-high properties, Ba(Ti0.8Zr0.2)O3-x(Ba0.7Ca0.3)TiO3(BZT-xBCT) nanocrystals was synthesized via a sol-gel method, and the corresponding thin films were also deposited on Pt/Ti/SiO2/Si substrates by a spin-coating approach. The BZT-xBCT thin film exhibited a high remnant polarization of 22.15 mu C cm(-2) with a large coercive field of 68.06 kV cm(-1). The resultant gel is calcined at various elevated temperatures and studied with FTIR/XRD/Raman/DSC-TGA/AFM/SEM techniques for gel composition, crystallization, phase transition, thermochemistry and the morphology of the film. Although the room temperature crystal structure of the BZT-xBCT nanocrystals appears to be a standard perovskite structure by conventional X-ray diffraction (XRD), Raman spectroscopy demonstrates the presence of non-centrosymmetric regions arising from the off-centering of the titanium (zirconium) atoms. The Raman spectra findings demonstrate the degree by which the tetragonal phase grows with the increase of calcining temperature in BZT-0.5BCT, and the characteristic ferroelectric-ferroelectric phase transition in BZT-xBCT while going through the MPB process. The structural and constituent evolution for the conversion process from gel to ceramic, as well as the formation mechanism of the BZT-0.5BCT crystallite, were also elucidated.

Heat-treating effect on the properties of Pb1-xla x(Zr0.4Ti0.6)O3 ferroelectric thin film prepared by a modified sol-gel process

Growth and ferroelectric properties of sol-gel derived Pb(Zr,Ti)O3 using inorganic zirconium precursor

Preparation on the [(Pb,La) (Zr,Ti)O3] ferroelectric thin films by using the Sol-Gel processing

THE PROCESSING EFFECTS ON STRUCTURE AND PROPERTIES OF SOL-GEL DERIVED PLZT FERROELECTRIC THIN FILMS

Effects of annealing treatment on fatigue recovery of lead zirconate titanate thin films

Effectof annealing temperature onthe propertiesof PZTferroelectric thinfilms inthe processof RTPwithSol-gel method

Effect of pyrolysis temperature on preferential orientation and electrical properties of sol-gel derived lead zirconate titanate films

Growth and Characterization of Lead Zirconate Titanate (PZT) Thin Films

Study of silicon-based ferroelectric thin films prepared by Sol-Gel method

Effect of Annealing Temperature on Properties of Barium Zirconium Titanate Thin Films Deposited by Sol-Gel Method

Energy-Storage Performance And Electrocaloric Effect In (100)-Oriented Pb0.97la0.02(Zr0.95ti0.05)O-3 Antiferroelectric Thick Films

Effects of annealing temperature on structure and electrical properties of sol–gel derived 0.65PMN-0.35PT thin film

Effect of annealing temperature on the energy storage properties of Ba(Zr0.35Ti0.65)O3 thin films prepared by sol–gel method

Combined Effect of Preferential Orientation and Zr/Ti Atomic Ratio on Electrical Properties of Pb(ZrxTi1−x)O3 Thin Films

Effects of Pb Excess and Temperature on Polarization Fatigue in Sol-Gel Derived Pb(Zr0.3ti0.7)O3 Thin Films

Pulsed Excimer Laser Deposition and Rapid Thermal Annealing of Ferroelectric Pb(Zr0.52Ti0.48)O3 Thin Films on Si-on-Insulator

Effect Of Annealing Temperature On Properties Of Sputtered Pzt Thin Films

Dielectric Properties of Oriented PbZrO3 Thin Films Grown by Sol-Gel Process

Crystallization, phase evolution and ferroelectric properties of sol-gel-synthesized Ba(Ti0.8Zr0.2)O3-x(Ba 0.7Ca0.3)TiO3 thin films

EFFECT OF HEAT TREATMENT PROCESS ON PROPERTIES OF CALCIUM STRONTIUM BISMUTH TITANATE FERROELECTRIC THIN FILMS

Improved electrical properties in PZT/PZ thin films by adjusting annealing temperature