Optical Characterization of Ge Quantum Dots Grown on Porous Silicon by UHV/CVD

王亚东,黄靖云,叶志镇,赵炳辉
DOI: https://doi.org/10.3321/j.issn:0253-4177.2001.09.005
2001-01-01
Abstract:The Ge quantum dots on anodized porous silicon layers were prepared by using area preferential nucleation at 700°C. Photoluminescence reveals a large blue shift in energy due to the effect of the quantum size. Intersubband absorption in the valence band was observed around 215 meV (5-6 μm wavelength) by Fourier transform infrared spectroscopy. The absorption is attributed to the transition between the first two heavy hole states of the Ge quantum dots. This study opens the potential route to the realization of Ge quantum dot infrared photodetectors.
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