Photoluminescence of Ge quantum dots buried in silicon

DongZhi Hu,Haijun Zhu,Zuimin Jiang,Daming Huang,Xiangjiu Zhang,Xun Wang
1997-01-01
Abstract:Ge quantum dots were grown by self-organizing growth method on Si(001) substrate at a temperature of 500��C, its photoluminescence spectrum was observed after annealing at 700��C for 20 min. Atomic force microscopy and cross-sectional transmission electron microscopy were used to observe the size and density of the quantum dots. Raman spectra were measured for the samples annealed at different temperatures in order to observe the inter-diffusion between Si and Ge atoms.
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