Study of corrugated diaphragms used in silicon condenser microphones

Quanbo Zou,Litian Liu,Zhijian Li
1996-01-01
Abstract:Silicon condenser microphone with corrugated diaphragm was designed and tested. The introduction of a well-performed corrugation deeply increased the mechanical sensitivity of the microphone diaphragm due to the reduction of the initial stress in thin films. Corrugations with different q values have been investigated, showing a strong relationship between the ratio of the depth of the corrugation to the diaphragm thickness and the mechanical sensitivity of the diaphragm. Three types of corrugation placements and five corrugation depths in a diaphragm area of 1mm by 1mm have been designed and fabricated. Microphones with a flat frequency response between 300Hz and 10kHz and a sensitivity of typically 5-28.3mV/Pa under a relatively low bias voltage of about 5-15V have been fabricated.
What problem does this paper attempt to address?