Robust Low Resistivity P-Type ZnO:Na Films after Ultraviolet Illumination: the Elimination of Grain Boundaries

S. S. Lin
DOI: https://doi.org/10.1063/1.4754003
IF: 4
2012-01-01
Applied Physics Letters
Abstract:We propose negatively charged oxygen species at grain boundaries may be detrimental to the p-type behavior. After ultraviolet illumination to release oxygen species, the p-type behavior of moderately Na-doped ZnO films is strengthened in the subsequent several minutes. A robust p-type film with a hole mobility of 7.9 cm2/Vs, a hole concentration of 2.1 × 1017 cm−3, and a film resistivity of 3.8 Ωcm has been reproducibly achieved. Transformation from n-type to p-type conduction is observed for the lightly Na-doped ZnO after ultraviolet illumination. We believe that single crystalline p-type ZnO films are indispensable for ZnO light-emitting diodes.
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